A Novel Dual-Mode Sensor for the Detection of Interface Flaw in “Insulator-Conductor” Composite Structures

Title

A Novel Dual-Mode Sensor for the Detection of Interface Flaw in “Insulator-Conductor” Composite Structures

Subject

Capacitance
capacitive sensor
Capacitive sensors
Conductors
Dual-mode sensor
eddy current
Eddy currents
Electrodes
interface flaw detection
Sensor phenomena and characterization
Sensors

Description

“Insulator-conductor” composite structures have been extensively used in a vast number of fields in recent years. However, due to different factors including but not limited to environmental and adverse working conditions, the interface between the insulator and conductor is prone to flaws. Therefore, non-destructive testing (NDT) techniques are needed to inspect the functionality and integrity of such composite structures. A dual-mode sensor that combines principles of eddy current and capacitive sensing is proposed to detect the interfacial flaws in “insulator-conductor” composite structures. The proposed sensor uses phase switching excitation to switch between inductive and capacitive detection modes, and the feasibility of the method was analyzed by equivalent circuit analysis and Finite Element (FE) simulations. The dual-mode sensor was fabricated on a single Printed Circuit Board (PCB) and used for experimental investigation on specimens of “Perspex-aluminum” composite structures. The experimental results verified the results of equivalent circuit analysis and FE simulation, and showed that the proposed sensor is able to detect corrosion under insulation, surface cracking on the conductor and interface debonding. Results also show that the detected information of the two modes complement each other, proving that the detection method has the ability to evaluate flaws in complex situations at the interface.
4568-4576
5
23

Creator

T. Zhu
M. Mwelango
X. Yin
X. Yuan
W. Li
G. Chen

Publisher

IEEE Sensors Journal

Date

2023

Type

journalArticle

Identifier

1558-1748

Collection

Citation

T. Zhu et al., “A Novel Dual-Mode Sensor for the Detection of Interface Flaw in “Insulator-Conductor” Composite Structures,” Lamar University Midstream Center Research, accessed May 14, 2024, https://lumc.omeka.net/items/show/27492.

Output Formats